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JCMsuite
Application Areas
Technology
Modules and Interfaces
Getting started
JCMsuite Applications in R&D
Documentation
Services
Consulting
Support
Training
Company
About
Contact
Projects
Blog
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JCMsuite
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JCMsuite Applications in R&D
Whispering gallery mode lasers for sensing applications
Tagged under
light sources
optical metrology and sensing
optical resonators and antennas
resonance mode computation
High harmonic generation in corrugated micrometer-scale waveguides
Tagged under
nonlinear optics
light scattering computation
Quantifying parameter uncertainties in optical scatterometry using Bayesian inversion
Tagged under
optical metrology and sensing
other fields
advanced finite element methods
optimization and parameter retrieval methods
uncertainty quantification methods
light scattering computation
Efficient single-photon source based on a deterministically fabricated single quantum dot microstructure with backside gold mirror
Tagged under
quantum optics
light sources
advanced finite element methods
FEM for validation of alternative scattering computation method
Tagged under
optical metrology and sensing
optical and EUV lithography
other fields
software benchmarks
light scattering computation
Enhanced Directional Emission from Monolayer WSe2 Integrated onto a Multiresonant Silicon-Based Photonic Structure
Tagged under
light sources
quantum optics
photonic crystals
integrated optics
metamaterials
light scattering computation
Optical field and attractive force at a subwavelength slit
Tagged under
plasmonics
other fields
diffractive optics
advanced finite element methods
light scattering computation
software benchmarks
Supercontinuum generation with microstructured photonic crystal fibers based on fluoride glass
Tagged under
photonic waveguides and fibers
light sources
nonlinear optics
propagation mode computation
Modeling of Optical Imaging of Finite Multi-Line Arrays
Tagged under
optical and EUV lithography
optical metrology and sensing
light scattering computation
other methods
Quantitative optical imaging for in-die-capable critical dimension targets
Tagged under
optical metrology and sensing
optical and EUV lithography
advanced finite element methods
optimization and parameter retrieval methods
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